APERTURELESS NEAR-FIELD SCANNING RAMAN MICROSCOPY USING REFLECTION SCATTERING GEOMETRY
WO2002068919A1
Saved in:
Main Authors: | SHEN, ZE XIANG, SUN, WANXIN |
---|---|
Other Authors: | PHYSICS |
Format: | Patent |
Published: |
2012
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/35454 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
APERTURELESS NEAR-FIELD SCANNING RAMAN MICROSCOPY USING REFLECTION SCATTERING GEOMETRY
by: SHEN, ZE XIANG, et al.
Published: (2012) -
Apertureless near-field scanning raman microscopy using reflection scattering geometry
by: SHEN, ZE XIANG, et al.
Published: (2012) -
Apertureless near-field scanning Raman microscopy using reflection scattering geometry
by: Sun, W.X., et al.
Published: (2014) -
Near-field scanning Raman microscopy using apertureless probes
by: Sun, W.X., et al.
Published: (2014) -
Preparation of cantilevered W tips for atomic force microscopy and apertureless near-field scanning optical microscopy
by: Sun, W.X., et al.
Published: (2014)