Investigation into Solder Joint Failure in Portable Electronics Subjected to Drop Impact

Ph.D

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Bibliographic Details
Main Author: SEAH KAH WOON, SIMON
Other Authors: MECHANICAL ENGINEERING
Format: Theses and Dissertations
Language:English
Published: 2012
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/35763
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Institution: National University of Singapore
Language: English
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spelling sg-nus-scholar.10635-357632015-01-14T09:33:37Z Investigation into Solder Joint Failure in Portable Electronics Subjected to Drop Impact SEAH KAH WOON, SIMON MECHANICAL ENGINEERING SHIM PHYAU WUI, VICTOR Solder Electronics Drop Shock Impact Fatigue Ph.D DOCTOR OF PHILOSOPHY 2012-12-14T18:00:07Z 2012-12-14T18:00:07Z 2012-08-17 Thesis SEAH KAH WOON, SIMON (2012-08-17). Investigation into Solder Joint Failure in Portable Electronics Subjected to Drop Impact. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/35763 NOT_IN_WOS en
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
language English
topic Solder Electronics Drop Shock Impact Fatigue
spellingShingle Solder Electronics Drop Shock Impact Fatigue
SEAH KAH WOON, SIMON
Investigation into Solder Joint Failure in Portable Electronics Subjected to Drop Impact
description Ph.D
author2 MECHANICAL ENGINEERING
author_facet MECHANICAL ENGINEERING
SEAH KAH WOON, SIMON
format Theses and Dissertations
author SEAH KAH WOON, SIMON
author_sort SEAH KAH WOON, SIMON
title Investigation into Solder Joint Failure in Portable Electronics Subjected to Drop Impact
title_short Investigation into Solder Joint Failure in Portable Electronics Subjected to Drop Impact
title_full Investigation into Solder Joint Failure in Portable Electronics Subjected to Drop Impact
title_fullStr Investigation into Solder Joint Failure in Portable Electronics Subjected to Drop Impact
title_full_unstemmed Investigation into Solder Joint Failure in Portable Electronics Subjected to Drop Impact
title_sort investigation into solder joint failure in portable electronics subjected to drop impact
publishDate 2012
url http://scholarbank.nus.edu.sg/handle/10635/35763
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