Measurement of residual stress using fiber electronic speckle pattern interferometry

Proceedings of SPIE - The International Society for Optical Engineering

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Bibliographic Details
Main Authors: Zhang, Jingbo, Fok, Wing C., Chong, Tow C.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/50632
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Institution: National University of Singapore