X-ray photoelectron spectroscopic study of InGaAsN grown by MOCVD

X-ray photoelectron spectroscopic study of InGaAsN grown by MOCVD

Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

Saved in:
Bibliographic Details
Main Authors: Chang, W., Lin, J., Zhou, W., Chua, S.J., Liu, Y.J., Wee, A.T.S.
Other Authors: INSTITUTE OF ENGINEERING SCIENCE
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/51275
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/51275

Similar Items