A fast and practical approach to the determination of junction temperature and thermal resistance for BJT/HBT devices

A fast and practical approach to the determination of junction temperature and thermal resistance for BJT/HBT devices

10.1002/mop.10648

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Bibliographic Details
Main Authors: Ooi, B.L., Chen, B., Lin, F., Kooi, P.S., Hui, C.S.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Bipolar transistor
HBT
Parameter extraction
Thermal resistance
Online Access:http://scholarbank.nus.edu.sg/handle/10635/54127
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/54127

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