A fast and practical approach to the determination of junction temperature and thermal resistance for BJT/HBT devices

A fast and practical approach to the determination of junction temperature and thermal resistance for BJT/HBT devices

2004 9th IEEE Singapore International Conference on Communication Systems, ICCS

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Bibliographic Details
Main Authors: Chen, B., Ooi, B.L., Kooi, P.S.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Bipolar Transistor
HBT
Parameter Extraction
Thermal Resistance
Online Access:http://scholarbank.nus.edu.sg/handle/10635/68793
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/68793

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