A fast and practical approach to the determination of junction temperature and thermal resistance for BJT/HBT devices
2004 9th IEEE Singapore International Conference on Communication Systems, ICCS
Saved in:
Main Authors: | Chen, B., Ooi, B.L., Kooi, P.S. |
---|---|
Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
|
Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/68793 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
A fast and practical approach to the determination of junction temperature and thermal resistance for BJT/HBT devices
by: Ooi, B.L., et al.
Published: (2014) -
Characterization and modeling of avalanche multiplication in HBTs
by: Lin, F., et al.
Published: (2014) -
SiGe HBTs model converting technique from SGP to VBIC model
by: Lin, F., et al.
Published: (2014) -
A distributed millimeter-wave small-signal HBT model based on electromagnetic simulation
by: Ooi, B.-L., et al.
Published: (2014) -
HBT characterization and modeling for nonlinear microwave circuit design
by: ZHOU TIANSHU
Published: (2010)