A memory efficient testing scheme for combined field integral equation for solving scattering problems using adaptive integral method
10.1002/jnm.591
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Main Authors: | Ng, T.H., Ooi, B.L., Kooi, P.S. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/54341 |
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Institution: | National University of Singapore |
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