A memory efficient testing scheme for combined field integral equation for solving scattering problems using adaptive integral method

10.1002/jnm.591

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Bibliographic Details
Main Authors: Ng, T.H., Ooi, B.L., Kooi, P.S.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/54341
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Institution: National University of Singapore
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