A methodology for accurate modeling of a pad structure from S-parameter measurements

A methodology for accurate modeling of a pad structure from S-parameter measurements

10.1002/mop.20740

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Bibliographic Details
Main Authors: Jayabalan, J., Ooi, B.L., Wu, B., Xu, D.S., Iyer, M.K., Leong, M.S.
Other Authors: MECHANICAL ENGINEERING
Format: Article
Published: 2014
Subjects:
Equivalent-circuit model
Pad models
Parameter extraction
S-parameter measurements
Wafer level package
Online Access:http://scholarbank.nus.edu.sg/handle/10635/54368
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/54368

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