A novel method for the De-embedding of S-parameters of double heterojunction δ-doped PHEMTs - Modeling and measurements

A novel method for the De-embedding of S-parameters of double heterojunction δ-doped PHEMTs - Modeling and measurements

2000 International Conference on Modeling and Simulation of Microsystems - MSM 2000

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Bibliographic Details
Main Authors: Rao, R.V.V.V.J., Joe, J., Chia, Y.W.M., Ang, K.S., Wang, H., Ng, G.I.
Other Authors: CENTRE FOR WIRELESS COMMUNICATIONS
Format: Conference or Workshop Item
Published: 2014
Subjects:
Equivalent circuits
On-wafer short
PHEMT
S-parameter Measurements
Semiconductor devices and materials
Online Access:http://scholarbank.nus.edu.sg/handle/10635/115365
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/115365

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