A novel method for the De-embedding of S-parameters of double heterojunction δ-doped PHEMTs - Modeling and measurements

2000 International Conference on Modeling and Simulation of Microsystems - MSM 2000

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Bibliographic Details
Main Authors:	Rao, R.V.V.V.J., Joe, J., Chia, Y.W.M., Ang, K.S., Wang, H., Ng, G.I.
Other Authors:	CENTRE FOR WIRELESS COMMUNICATIONS
Format:	Conference or Workshop Item
Published:	2014
Subjects:	Equivalent circuits On-wafer short PHEMT S-parameter Measurements Semiconductor devices and materials
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/115365
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-115365
record_format	dspace
spelling	sg-nus-scholar.10635-1153652015-01-06T09:50:53Z A novel method for the De-embedding of S-parameters of double heterojunction δ-doped PHEMTs - Modeling and measurements Rao, R.V.V.V.J. Joe, J. Chia, Y.W.M. Ang, K.S. Wang, H. Ng, G.I. CENTRE FOR WIRELESS COMMUNICATIONS Equivalent circuits On-wafer short PHEMT S-parameter Measurements Semiconductor devices and materials 2000 International Conference on Modeling and Simulation of Microsystems - MSM 2000 309-312 2014-12-12T07:14:41Z 2014-12-12T07:14:41Z 2000 Conference Paper Rao, R.V.V.V.J.,Joe, J.,Chia, Y.W.M.,Ang, K.S.,Wang, H.,Ng, G.I. (2000). A novel method for the De-embedding of S-parameters of double heterojunction δ-doped PHEMTs - Modeling and measurements. 2000 International Conference on Modeling and Simulation of Microsystems - MSM 2000 : 309-312. ScholarBank@NUS Repository. 0966613570 http://scholarbank.nus.edu.sg/handle/10635/115365 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
topic	Equivalent circuits On-wafer short PHEMT S-parameter Measurements Semiconductor devices and materials
spellingShingle	Equivalent circuits On-wafer short PHEMT S-parameter Measurements Semiconductor devices and materials Rao, R.V.V.V.J. Joe, J. Chia, Y.W.M. Ang, K.S. Wang, H. Ng, G.I. A novel method for the De-embedding of S-parameters of double heterojunction δ-doped PHEMTs - Modeling and measurements
description	2000 International Conference on Modeling and Simulation of Microsystems - MSM 2000
author2	CENTRE FOR WIRELESS COMMUNICATIONS
author_facet	CENTRE FOR WIRELESS COMMUNICATIONS Rao, R.V.V.V.J. Joe, J. Chia, Y.W.M. Ang, K.S. Wang, H. Ng, G.I.
format	Conference or Workshop Item
author	Rao, R.V.V.V.J. Joe, J. Chia, Y.W.M. Ang, K.S. Wang, H. Ng, G.I.
author_sort	Rao, R.V.V.V.J.
title	A novel method for the De-embedding of S-parameters of double heterojunction δ-doped PHEMTs - Modeling and measurements
title_short	A novel method for the De-embedding of S-parameters of double heterojunction δ-doped PHEMTs - Modeling and measurements
title_full	A novel method for the De-embedding of S-parameters of double heterojunction δ-doped PHEMTs - Modeling and measurements
title_fullStr	A novel method for the De-embedding of S-parameters of double heterojunction δ-doped PHEMTs - Modeling and measurements
title_full_unstemmed	A novel method for the De-embedding of S-parameters of double heterojunction δ-doped PHEMTs - Modeling and measurements
title_sort	novel method for the de-embedding of s-parameters of double heterojunction δ-doped phemts - modeling and measurements
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/115365
_version_	1681094972681486336

A novel method for the De-embedding of S-parameters of double heterojunction δ-doped PHEMTs - Modeling and measurements

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