A novel method for the De-embedding of S-parameters of double heterojunction δ-doped PHEMTs - Modeling and measurements

• Main Authors: Rao, R.V.V.V.J., Joe, J., Chia, Y.W.M., Ang, K.S., Wang, H., Ng, G.I.
• Other Authors: CENTRE FOR WIRELESS COMMUNICATIONS
• Format: Conference or Workshop Item
• Published: 2014
• Subjects: Equivalent circuits; On-wafer short; PHEMT; S-parameter Measurements; Semiconductor devices and materials
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/115365
• Institution: National University of Singapore

2000 International Conference on Modeling and Simulation of Microsystems - MSM 2000