A novel hot carrier reliability monitor for LDD p-MOSFETs

10.1016/0038-1101(94)90063-9

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Bibliographic Details
Main Authors:	Pan, Y., Ng, K.K., Kwong, V.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/54613
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Institution:	National University of Singapore

Description
Summary:	10.1016/0038-1101(94)90063-9

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