A novel hot carrier reliability monitor for LDD p-MOSFETs

10.1016/0038-1101(94)90063-9

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Bibliographic Details
Main Authors:	Pan, Y., Ng, K.K., Kwong, V.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/54613
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-54613
record_format	dspace
spelling	sg-nus-scholar.10635-546132023-10-29T21:45:11Z A novel hot carrier reliability monitor for LDD p-MOSFETs Pan, Y. Ng, K.K. Kwong, V. ELECTRICAL ENGINEERING 10.1016/0038-1101(94)90063-9 Solid-State Electronics 37 12 1961-1965 SSELA 2014-06-16T09:32:57Z 2014-06-16T09:32:57Z 1994 Article Pan, Y., Ng, K.K., Kwong, V. (1994). A novel hot carrier reliability monitor for LDD p-MOSFETs. Solid-State Electronics 37 (12) : 1961-1965. ScholarBank@NUS Repository. https://doi.org/10.1016/0038-1101(94)90063-9 00381101 http://scholarbank.nus.edu.sg/handle/10635/54613 A1994PV09200009 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1016/0038-1101(94)90063-9
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Pan, Y. Ng, K.K. Kwong, V.
format	Article
author	Pan, Y. Ng, K.K. Kwong, V.
spellingShingle	Pan, Y. Ng, K.K. Kwong, V. A novel hot carrier reliability monitor for LDD p-MOSFETs
author_sort	Pan, Y.
title	A novel hot carrier reliability monitor for LDD p-MOSFETs
title_short	A novel hot carrier reliability monitor for LDD p-MOSFETs
title_full	A novel hot carrier reliability monitor for LDD p-MOSFETs
title_fullStr	A novel hot carrier reliability monitor for LDD p-MOSFETs
title_full_unstemmed	A novel hot carrier reliability monitor for LDD p-MOSFETs
title_sort	novel hot carrier reliability monitor for ldd p-mosfets
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/54613
_version_	1781412004992385024

A novel hot carrier reliability monitor for LDD p-MOSFETs

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