An automated methodology for the tracking of electrical performance for memory test systems

10.1109/TIM.2006.873816

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Bibliographic Details
Main Authors: Mamun, A.A., Wang, L.F., Tan, K.C., Heng, H.M., Ho, P.C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/54998
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Institution: National University of Singapore