Automating the tracking of electrical performance for memory test systems

Automating the tracking of electrical performance for memory test systems

Conference Record - IEEE Instrumentation and Measurement Technology Conference

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Bibliographic Details
Main Authors: Tan, K.C., Mamun, A.A.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Automation
Electrical performance tracking
Memory test system
Testing
Online Access:http://scholarbank.nus.edu.sg/handle/10635/69479
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/69479

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