Automating the tracking of electrical performance for memory test systems
Conference Record - IEEE Instrumentation and Measurement Technology Conference
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2014
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sg-nus-scholar.10635-694792024-11-08T20:28:03Z Automating the tracking of electrical performance for memory test systems Tan, K.C. Mamun, A.A. ELECTRICAL & COMPUTER ENGINEERING Automation Electrical performance tracking Memory test system Testing Conference Record - IEEE Instrumentation and Measurement Technology Conference 2 1509-1514 CRIIE 2014-06-19T03:01:12Z 2014-06-19T03:01:12Z 2004 Conference Paper Tan, K.C.,Mamun, A.A. (2004). Automating the tracking of electrical performance for memory test systems. Conference Record - IEEE Instrumentation and Measurement Technology Conference 2 : 1509-1514. ScholarBank@NUS Repository. 10915281 http://scholarbank.nus.edu.sg/handle/10635/69479 NOT_IN_WOS Scopus |
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Automation Electrical performance tracking Memory test system Testing |
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Automation Electrical performance tracking Memory test system Testing Tan, K.C. Mamun, A.A. Automating the tracking of electrical performance for memory test systems |
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Conference Record - IEEE Instrumentation and Measurement Technology Conference |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Tan, K.C. Mamun, A.A. |
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Conference or Workshop Item |
author |
Tan, K.C. Mamun, A.A. |
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Tan, K.C. |
title |
Automating the tracking of electrical performance for memory test systems |
title_short |
Automating the tracking of electrical performance for memory test systems |
title_full |
Automating the tracking of electrical performance for memory test systems |
title_fullStr |
Automating the tracking of electrical performance for memory test systems |
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Automating the tracking of electrical performance for memory test systems |
title_sort |
automating the tracking of electrical performance for memory test systems |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/69479 |
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1821198663335018496 |