Double exchange biased magnetic force microscopy tip and comparison of its imaging performance with commercial tips
10.1143/JJAP.46.4403
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Main Authors: | Han, G., Wu, Y., Zheng, Y. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/55694 |
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Institution: | National University of Singapore |
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