Double exchange biased magnetic force microscopy tip and comparison of its imaging performance with commercial tips

10.1143/JJAP.46.4403

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Bibliographic Details
Main Authors: Han, G., Wu, Y., Zheng, Y.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/55694
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Institution: National University of Singapore

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