Characterization of high-density bit-patterned media using ultra-high resolution magnetic force microscopy

Characterization of high-density bit-patterned media using ultra-high resolution magnetic force microscopy

10.1002/pssr.201105537

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Bibliographic Details
Main Authors: Piramanayagam, S.N., Ranjbar, M., Sbiaa, R., Tavakkoli K.G.A., Chong, T.C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Bit-patterned media
Magnetic force microscopy
Nanostructures
Perpendicular magnetic anisotropy
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82041
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/82041

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