Characterization of high-density bit-patterned media using ultra-high resolution magnetic force microscopy

Characterization of high-density bit-patterned media using ultra-high resolution magnetic force microscopy

10.1002/pssr.201105537

Saved in:
Bibliographic Details
Main Authors: Piramanayagam, S.N., Ranjbar, M., Sbiaa, R., Tavakkoli K.G.A., Chong, T.C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Subjects:
Bit-patterned media
Magnetic force microscopy
Nanostructures
Perpendicular magnetic anisotropy
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82041
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
Description
Summary:10.1002/pssr.201105537

Similar Items