Evolution of quasi-breakdown in thin gate oxides

10.1063/1.1464648

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Bibliographic Details
Main Authors:	Loh, W.Y., Cho, B.J., Li, M.F.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/55923
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Institution:	National University of Singapore

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Summary:	10.1063/1.1464648

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