Evolution of quasi-breakdown in thin gate oxides

10.1063/1.1464648

Saved in:

Bibliographic Details
Main Authors:	Loh, W.Y., Cho, B.J., Li, M.F.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/55923
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore

id	sg-nus-scholar.10635-55923
record_format	dspace
spelling	sg-nus-scholar.10635-559232023-10-25T20:21:51Z Evolution of quasi-breakdown in thin gate oxides Loh, W.Y. Cho, B.J. Li, M.F. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.1464648 Journal of Applied Physics 91 8 5302-5306 JAPIA 2014-06-17T02:48:39Z 2014-06-17T02:48:39Z 2002-04-15 Article Loh, W.Y., Cho, B.J., Li, M.F. (2002-04-15). Evolution of quasi-breakdown in thin gate oxides. Journal of Applied Physics 91 (8) : 5302-5306. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1464648 00218979 http://scholarbank.nus.edu.sg/handle/10635/55923 000174666600084 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1063/1.1464648
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Loh, W.Y. Cho, B.J. Li, M.F.
format	Article
author	Loh, W.Y. Cho, B.J. Li, M.F.
spellingShingle	Loh, W.Y. Cho, B.J. Li, M.F. Evolution of quasi-breakdown in thin gate oxides
author_sort	Loh, W.Y.
title	Evolution of quasi-breakdown in thin gate oxides
title_short	Evolution of quasi-breakdown in thin gate oxides
title_full	Evolution of quasi-breakdown in thin gate oxides
title_fullStr	Evolution of quasi-breakdown in thin gate oxides
title_full_unstemmed	Evolution of quasi-breakdown in thin gate oxides
title_sort	evolution of quasi-breakdown in thin gate oxides
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/55923
_version_	1781781080579244032

Evolution of quasi-breakdown in thin gate oxides

Similar Items