Exchange bias and magnetotransport properties in IrMn/NiFe/FeMn structures

10.1103/PhysRevB.78.184413

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Bibliographic Details
Main Authors:	Guo, Z.B., Wu, Y.H., Qiu, J.J., Zong, B.Y., Han, G.C.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/55946
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Institution:	National University of Singapore

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