High-resolution nanowire atomic force microscope probe grown by a field-emission induced process
10.1063/1.1765202
Saved in:
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Published: |
2014
|
| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/56208 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | National University of Singapore |
| id |
sg-nus-scholar.10635-56208 |
|---|---|
| record_format |
dspace |
| spelling |
sg-nus-scholar.10635-562082023-08-29T08:44:44Z High-resolution nanowire atomic force microscope probe grown by a field-emission induced process Tay, A.B.H. Thong, J.T.L. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.1765202 Applied Physics Letters 84 25 5207-5209 APPLA 2014-06-17T02:51:58Z 2014-06-17T02:51:58Z 2004-06-21 Article Tay, A.B.H., Thong, J.T.L. (2004-06-21). High-resolution nanowire atomic force microscope probe grown by a field-emission induced process. Applied Physics Letters 84 (25) : 5207-5209. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1765202 00036951 http://scholarbank.nus.edu.sg/handle/10635/56208 000222111800047 Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| description |
10.1063/1.1765202 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Tay, A.B.H. Thong, J.T.L. |
| format |
Article |
| author |
Tay, A.B.H. Thong, J.T.L. |
| spellingShingle |
Tay, A.B.H. Thong, J.T.L. High-resolution nanowire atomic force microscope probe grown by a field-emission induced process |
| author_sort |
Tay, A.B.H. |
| title |
High-resolution nanowire atomic force microscope probe grown by a field-emission induced process |
| title_short |
High-resolution nanowire atomic force microscope probe grown by a field-emission induced process |
| title_full |
High-resolution nanowire atomic force microscope probe grown by a field-emission induced process |
| title_fullStr |
High-resolution nanowire atomic force microscope probe grown by a field-emission induced process |
| title_full_unstemmed |
High-resolution nanowire atomic force microscope probe grown by a field-emission induced process |
| title_sort |
high-resolution nanowire atomic force microscope probe grown by a field-emission induced process |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/56208 |
| _version_ |
1775627194130759680 |