High-resolution nanowire atomic force microscope probe grown by a field-emission induced process
10.1063/1.1765202
Saved in:
Main Authors: | Tay, A.B.H., Thong, J.T.L. |
---|---|
Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/56208 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique
by: Tay, A.B.H., et al.
Published: (2014) -
High-resolution atomic force microscope nanotip grown by self-field emission
by: Oon, C.H., et al.
Published: (2014) -
Metallic nanowires grown via field-emission induced growth as electron sources
by: Thong, J.T.L.
Published: (2014) -
Scanning probe microscope tips grown by a field-emission process
by: TAY BOON HAU, ARTHUR
Published: (2011) -
Connection of nanostructures using nanowires grown by a self-field emission process
by: Thong, J.T.L., et al.
Published: (2014)