Investigation of Li-doped ferroelectric and piezoelectric ZnO films by electric force microscopy and Raman spectroscopy

10.1063/1.1391225

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Bibliographic Details
Main Authors: Ni, H.Q., Lu, Y.F., Liu, Z.Y., Qiu, H., Wang, W.J., Ren, Z.M., Chow, S.K., Jie, Y.X.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/56400
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Institution: National University of Singapore