Investigation of Li-doped ferroelectric and piezoelectric ZnO films by electric force microscopy and Raman spectroscopy

• Main Authors: Ni, H.Q., Lu, Y.F., Liu, Z.Y., Qiu, H., Wang, W.J., Ren, Z.M., Chow, S.K., Jie, Y.X.
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Article
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/56400
• Institution: National University of Singapore

10.1063/1.1391225