Regression from uncertain labels and its applications to soft biometrics

10.1109/TIFS.2008.2006585

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Bibliographic Details
Main Authors: Yan, S., Wang, H., Tang, X., Liu, J., Huang, T.S.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
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Online Access:http://scholarbank.nus.edu.sg/handle/10635/57235
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Institution: National University of Singapore

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