Robust process identification from relay tests in the presence of nonzero initial conditions and disturbance
10.1021/ie051317g
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sg-nus-scholar.10635-573122024-11-14T03:23:22Z Robust process identification from relay tests in the presence of nonzero initial conditions and disturbance Wang, Q.-G. Liu, M. Hang, C.C. Tang, W. ELECTRICAL & COMPUTER ENGINEERING 10.1021/ie051317g Industrial and Engineering Chemistry Research 45 12 4063-4070 IECRE 2014-06-17T03:04:45Z 2014-06-17T03:04:45Z 2006-06-07 Article Wang, Q.-G., Liu, M., Hang, C.C., Tang, W. (2006-06-07). Robust process identification from relay tests in the presence of nonzero initial conditions and disturbance. Industrial and Engineering Chemistry Research 45 (12) : 4063-4070. ScholarBank@NUS Repository. https://doi.org/10.1021/ie051317g 08885885 http://scholarbank.nus.edu.sg/handle/10635/57312 000237934700007 Scopus |
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10.1021/ie051317g |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Wang, Q.-G. Liu, M. Hang, C.C. Tang, W. |
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Wang, Q.-G. Liu, M. Hang, C.C. Tang, W. |
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Wang, Q.-G. Liu, M. Hang, C.C. Tang, W. Robust process identification from relay tests in the presence of nonzero initial conditions and disturbance |
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Wang, Q.-G. |
title |
Robust process identification from relay tests in the presence of nonzero initial conditions and disturbance |
title_short |
Robust process identification from relay tests in the presence of nonzero initial conditions and disturbance |
title_full |
Robust process identification from relay tests in the presence of nonzero initial conditions and disturbance |
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Robust process identification from relay tests in the presence of nonzero initial conditions and disturbance |
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Robust process identification from relay tests in the presence of nonzero initial conditions and disturbance |
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robust process identification from relay tests in the presence of nonzero initial conditions and disturbance |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/57312 |
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