Robust process identification from relay tests in the presence of nonzero initial conditions and disturbance
10.1021/ie051317g
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Main Authors: | Wang, Q.-G., Liu, M., Hang, C.C., Tang, W. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/57312 |
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Institution: | National University of Singapore |
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