Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sites

Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sites

10.1063/1.2875776

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Bibliographic Details
Main Authors: Wong, K.M., Chim, W.K., Huang, J.Q., Zhu, L.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/57331
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Institution: National University of Singapore
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Summary:10.1063/1.2875776

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