Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sites
10.1063/1.2875776
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sg-nus-scholar.10635-573312023-10-30T21:48:18Z Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sites Wong, K.M. Chim, W.K. Huang, J.Q. Zhu, L. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.2875776 Journal of Applied Physics 103 5 - JAPIA 2014-06-17T03:04:58Z 2014-06-17T03:04:58Z 2008 Article Wong, K.M., Chim, W.K., Huang, J.Q., Zhu, L. (2008). Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sites. Journal of Applied Physics 103 (5) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2875776 00218979 http://scholarbank.nus.edu.sg/handle/10635/57331 000254025000094 Scopus |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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| description |
10.1063/1.2875776 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Wong, K.M. Chim, W.K. Huang, J.Q. Zhu, L. |
| format |
Article |
| author |
Wong, K.M. Chim, W.K. Huang, J.Q. Zhu, L. |
| spellingShingle |
Wong, K.M. Chim, W.K. Huang, J.Q. Zhu, L. Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sites |
| author_sort |
Wong, K.M. |
| title |
Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sites |
| title_short |
Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sites |
| title_full |
Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sites |
| title_fullStr |
Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sites |
| title_full_unstemmed |
Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sites |
| title_sort |
scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sites |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/57331 |
| _version_ |
1781781389792772096 |