Single contact optical beam induced currents
10.1016/S0026-2714(00)00223-7
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sg-nus-scholar.10635-574142023-08-23T20:19:29Z Single contact optical beam induced currents Chin, J.M. Phang, J.C.H. Chan, D.S.H. Palaniappan, M. Gilfeather, G. Soh, C.E. ELECTRICAL & COMPUTER ENGINEERING 10.1016/S0026-2714(00)00223-7 Microelectronics Reliability 41 8 1237-1242 MCRLA 2014-06-17T03:05:55Z 2014-06-17T03:05:55Z 2001-08 Article Chin, J.M., Phang, J.C.H., Chan, D.S.H., Palaniappan, M., Gilfeather, G., Soh, C.E. (2001-08). Single contact optical beam induced currents. Microelectronics Reliability 41 (8) : 1237-1242. ScholarBank@NUS Repository. https://doi.org/10.1016/S0026-2714(00)00223-7 00262714 http://scholarbank.nus.edu.sg/handle/10635/57414 000171269500017 Scopus |
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10.1016/S0026-2714(00)00223-7 |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Chin, J.M. Phang, J.C.H. Chan, D.S.H. Palaniappan, M. Gilfeather, G. Soh, C.E. |
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Chin, J.M. Phang, J.C.H. Chan, D.S.H. Palaniappan, M. Gilfeather, G. Soh, C.E. |
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Chin, J.M. Phang, J.C.H. Chan, D.S.H. Palaniappan, M. Gilfeather, G. Soh, C.E. Single contact optical beam induced currents |
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Chin, J.M. |
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Single contact optical beam induced currents |
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Single contact optical beam induced currents |
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Single contact optical beam induced currents |
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Single contact optical beam induced currents |
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Single contact optical beam induced currents |
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single contact optical beam induced currents |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/57414 |
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