Study of the electronic structure of individual free-standing germanium nanodots using spectroscopic scanning capacitance microscopy
10.1143/JJAP.48.085002
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sg-nus-scholar.10635-575412023-10-30T21:52:16Z Study of the electronic structure of individual free-standing germanium nanodots using spectroscopic scanning capacitance microscopy Wong, K.M. ELECTRICAL & COMPUTER ENGINEERING 10.1143/JJAP.48.085002 Japanese Journal of Applied Physics 48 8 Part 1 0850021-08500212 2014-06-17T03:07:21Z 2014-06-17T03:07:21Z 2009 Article Wong, K.M. (2009). Study of the electronic structure of individual free-standing germanium nanodots using spectroscopic scanning capacitance microscopy. Japanese Journal of Applied Physics 48 (8 Part 1) : 0850021-08500212. ScholarBank@NUS Repository. https://doi.org/10.1143/JJAP.48.085002 00214922 http://scholarbank.nus.edu.sg/handle/10635/57541 000269497300063 Scopus |
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10.1143/JJAP.48.085002 |
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ELECTRICAL & COMPUTER ENGINEERING |
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ELECTRICAL & COMPUTER ENGINEERING Wong, K.M. |
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Wong, K.M. |
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Wong, K.M. Study of the electronic structure of individual free-standing germanium nanodots using spectroscopic scanning capacitance microscopy |
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Wong, K.M. |
title |
Study of the electronic structure of individual free-standing germanium nanodots using spectroscopic scanning capacitance microscopy |
title_short |
Study of the electronic structure of individual free-standing germanium nanodots using spectroscopic scanning capacitance microscopy |
title_full |
Study of the electronic structure of individual free-standing germanium nanodots using spectroscopic scanning capacitance microscopy |
title_fullStr |
Study of the electronic structure of individual free-standing germanium nanodots using spectroscopic scanning capacitance microscopy |
title_full_unstemmed |
Study of the electronic structure of individual free-standing germanium nanodots using spectroscopic scanning capacitance microscopy |
title_sort |
study of the electronic structure of individual free-standing germanium nanodots using spectroscopic scanning capacitance microscopy |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/57541 |
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