The Link between Gallium Vacancies and Plasma Damage to n-Type GaN

10.1002/1521-396X(200111)188:1<393

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Bibliographic Details
Main Authors:	Choi, H.W., Chua, S.J.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/57627
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Institution:	National University of Singapore

Description
Summary:	10.1002/1521-396X(200111)188:1<393

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