Morphological and structural analyses of plasma-induced damage to n-type GaN

10.1063/1.1509844

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Bibliographic Details
Main Authors: Choi, H.W., Chua, S.J., Tripathy, S.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82721
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Institution: National University of Singapore