Theoretical model of interface trap density using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurements
10.1063/1.2177352
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2014
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sg-nus-scholar.10635-576432023-10-31T20:17:19Z Theoretical model of interface trap density using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurements Wong, K.M. Chim, W.K. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.2177352 Applied Physics Letters 88 8 - APPLA 2014-06-17T03:08:32Z 2014-06-17T03:08:32Z 2006 Article Wong, K.M., Chim, W.K. (2006). Theoretical model of interface trap density using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurements. Applied Physics Letters 88 (8) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2177352 00036951 http://scholarbank.nus.edu.sg/handle/10635/57643 000235553300091 Scopus |
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Asia |
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Singapore Singapore |
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| description |
10.1063/1.2177352 |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Wong, K.M. Chim, W.K. |
| format |
Article |
| author |
Wong, K.M. Chim, W.K. |
| spellingShingle |
Wong, K.M. Chim, W.K. Theoretical model of interface trap density using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurements |
| author_sort |
Wong, K.M. |
| title |
Theoretical model of interface trap density using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurements |
| title_short |
Theoretical model of interface trap density using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurements |
| title_full |
Theoretical model of interface trap density using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurements |
| title_fullStr |
Theoretical model of interface trap density using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurements |
| title_full_unstemmed |
Theoretical model of interface trap density using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurements |
| title_sort |
theoretical model of interface trap density using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurements |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/57643 |
| _version_ |
1781781449202991104 |