Surface roughness measurement in the submicrometer range using laser scattering

10.1117/1.602535

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Bibliographic Details
Main Authors:	Wang, S.H., Quan, C., Tay, C.J., Shang, H.M.
Other Authors:	MECHANICAL & PRODUCTION ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/58753
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Institution:	National University of Singapore

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Summary:	10.1117/1.602535

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