Using the scanning electron microscope to obtain unique grain orientations from crystallographic traces on a single surface

Using the scanning electron microscope to obtain unique grain orientations from crystallographic traces on a single surface

10.1007/BF00722864

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Bibliographic Details
Main Authors: Fong, H.S., Lim, S.C., Lim, P.Y.
Other Authors: MECHANICAL & PRODUCTION ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/58886
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/58886

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