Using the scanning electron microscope to obtain unique grain orientations from crystallographic traces on a single surface

10.1007/BF00722864

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Main Authors:	Fong, H.S., Lim, S.C., Lim, P.Y.
Other Authors:	MECHANICAL & PRODUCTION ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/58886
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-58886
record_format	dspace
spelling	sg-nus-scholar.10635-588862023-10-30T07:56:20Z Using the scanning electron microscope to obtain unique grain orientations from crystallographic traces on a single surface Fong, H.S. Lim, S.C. Lim, P.Y. MECHANICAL & PRODUCTION ENGINEERING 10.1007/BF00722864 Journal of Materials Science Letters 9 1 43-45 JMSLD 2014-06-17T05:19:29Z 2014-06-17T05:19:29Z 1990-01 Article Fong, H.S., Lim, S.C., Lim, P.Y. (1990-01). Using the scanning electron microscope to obtain unique grain orientations from crystallographic traces on a single surface. Journal of Materials Science Letters 9 (1) : 43-45. ScholarBank@NUS Repository. https://doi.org/10.1007/BF00722864 02618028 http://scholarbank.nus.edu.sg/handle/10635/58886 A1990CK92200019 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1007/BF00722864
author2	MECHANICAL & PRODUCTION ENGINEERING
author_facet	MECHANICAL & PRODUCTION ENGINEERING Fong, H.S. Lim, S.C. Lim, P.Y.
format	Article
author	Fong, H.S. Lim, S.C. Lim, P.Y.
spellingShingle	Fong, H.S. Lim, S.C. Lim, P.Y. Using the scanning electron microscope to obtain unique grain orientations from crystallographic traces on a single surface
author_sort	Fong, H.S.
title	Using the scanning electron microscope to obtain unique grain orientations from crystallographic traces on a single surface
title_short	Using the scanning electron microscope to obtain unique grain orientations from crystallographic traces on a single surface
title_full	Using the scanning electron microscope to obtain unique grain orientations from crystallographic traces on a single surface
title_fullStr	Using the scanning electron microscope to obtain unique grain orientations from crystallographic traces on a single surface
title_full_unstemmed	Using the scanning electron microscope to obtain unique grain orientations from crystallographic traces on a single surface
title_sort	using the scanning electron microscope to obtain unique grain orientations from crystallographic traces on a single surface
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/58886
_version_	1781781546444783616

Using the scanning electron microscope to obtain unique grain orientations from crystallographic traces on a single surface

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