A transient capacitance-voltage method for characterizing DX centres

10.1088/0268-1242/11/12/004

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Bibliographic Details
Main Authors:	Jia, Y.B., Grimmeiss, H.G., Li, M.F.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/61727
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-61727
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spelling	sg-nus-scholar.10635-617272024-11-10T17:47:42Z A transient capacitance-voltage method for characterizing DX centres Jia, Y.B. Grimmeiss, H.G. Li, M.F. ELECTRICAL ENGINEERING 10.1088/0268-1242/11/12/004 Semiconductor Science and Technology 11 12 1787-1790 SSTEE 2014-06-17T06:43:19Z 2014-06-17T06:43:19Z 1996-12 Article Jia, Y.B., Grimmeiss, H.G., Li, M.F. (1996-12). A transient capacitance-voltage method for characterizing DX centres. Semiconductor Science and Technology 11 (12) : 1787-1790. ScholarBank@NUS Repository. https://doi.org/10.1088/0268-1242/11/12/004 02681242 http://scholarbank.nus.edu.sg/handle/10635/61727 A1996VY01700004 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1088/0268-1242/11/12/004
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Jia, Y.B. Grimmeiss, H.G. Li, M.F.
format	Article
author	Jia, Y.B. Grimmeiss, H.G. Li, M.F.
spellingShingle	Jia, Y.B. Grimmeiss, H.G. Li, M.F. A transient capacitance-voltage method for characterizing DX centres
author_sort	Jia, Y.B.
title	A transient capacitance-voltage method for characterizing DX centres
title_short	A transient capacitance-voltage method for characterizing DX centres
title_full	A transient capacitance-voltage method for characterizing DX centres
title_fullStr	A transient capacitance-voltage method for characterizing DX centres
title_full_unstemmed	A transient capacitance-voltage method for characterizing DX centres
title_sort	transient capacitance-voltage method for characterizing dx centres
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/61727
_version_	1821229327999565824

A transient capacitance-voltage method for characterizing DX centres

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