An analytical model for scanning electron microscope Type I magnetic contrast with energy filtering

An analytical model for scanning electron microscope Type I magnetic contrast with energy filtering

10.1063/1.1145243

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Bibliographic Details
Main Author: Chim, W.K.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/61792
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Institution: National University of Singapore
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Summary:10.1063/1.1145243

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