Determination of minority carrier diffusion lengths in semiconductor wafers with non-uniform carrier lifetimes by the surface photovoltage technique

Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD

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Main Authors:	Tan, L.S., Huynh, F.N.L.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/62028
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-620282024-11-08T21:38:18Z Determination of minority carrier diffusion lengths in semiconductor wafers with non-uniform carrier lifetimes by the surface photovoltage technique Tan, L.S. Huynh, F.N.L. ELECTRICAL ENGINEERING Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD 318-321 00268 2014-06-17T06:46:38Z 2014-06-17T06:46:38Z 1999 Article Tan, L.S.,Huynh, F.N.L. (1999). Determination of minority carrier diffusion lengths in semiconductor wafers with non-uniform carrier lifetimes by the surface photovoltage technique. Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD : 318-321. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/62028 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Tan, L.S. Huynh, F.N.L.
format	Article
author	Tan, L.S. Huynh, F.N.L.
spellingShingle	Tan, L.S. Huynh, F.N.L. Determination of minority carrier diffusion lengths in semiconductor wafers with non-uniform carrier lifetimes by the surface photovoltage technique
author_sort	Tan, L.S.
title	Determination of minority carrier diffusion lengths in semiconductor wafers with non-uniform carrier lifetimes by the surface photovoltage technique
title_short	Determination of minority carrier diffusion lengths in semiconductor wafers with non-uniform carrier lifetimes by the surface photovoltage technique
title_full	Determination of minority carrier diffusion lengths in semiconductor wafers with non-uniform carrier lifetimes by the surface photovoltage technique
title_fullStr	Determination of minority carrier diffusion lengths in semiconductor wafers with non-uniform carrier lifetimes by the surface photovoltage technique
title_full_unstemmed	Determination of minority carrier diffusion lengths in semiconductor wafers with non-uniform carrier lifetimes by the surface photovoltage technique
title_sort	determination of minority carrier diffusion lengths in semiconductor wafers with non-uniform carrier lifetimes by the surface photovoltage technique
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/62028
_version_	1821182161294721024

Determination of minority carrier diffusion lengths in semiconductor wafers with non-uniform carrier lifetimes by the surface photovoltage technique

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