Determination of minority carrier diffusion lengths in the denuded zones of silicon wafers by surface photovoltage measurements

Determination of minority carrier diffusion lengths in the denuded zones of silicon wafers by surface photovoltage measurements

Proceedings of SPIE - The International Society for Optical Engineering

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Bibliographic Details
Main Authors: Tan, L.S., Koh, S.H., Prakash, S., Choi, W.K., Zhang, Z.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/72572
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/72572

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