Determination of minority carrier diffusion lengths in the denuded zones of silicon wafers by surface photovoltage measurements

Proceedings of SPIE - The International Society for Optical Engineering

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Main Authors:	Tan, L.S., Koh, S.H., Prakash, S., Choi, W.K., Zhang, Z.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/72572
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-725722024-11-14T03:35:26Z Determination of minority carrier diffusion lengths in the denuded zones of silicon wafers by surface photovoltage measurements Tan, L.S. Koh, S.H. Prakash, S. Choi, W.K. Zhang, Z. ELECTRICAL ENGINEERING Proceedings of SPIE - The International Society for Optical Engineering 3975 I/- PSISD 2014-06-19T05:09:33Z 2014-06-19T05:09:33Z 2000 Conference Paper Tan, L.S.,Koh, S.H.,Prakash, S.,Choi, W.K.,Zhang, Z. (2000). Determination of minority carrier diffusion lengths in the denuded zones of silicon wafers by surface photovoltage measurements. Proceedings of SPIE - The International Society for Optical Engineering 3975 : I/-. ScholarBank@NUS Repository. 0277786X http://scholarbank.nus.edu.sg/handle/10635/72572 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Proceedings of SPIE - The International Society for Optical Engineering
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Tan, L.S. Koh, S.H. Prakash, S. Choi, W.K. Zhang, Z.
format	Conference or Workshop Item
author	Tan, L.S. Koh, S.H. Prakash, S. Choi, W.K. Zhang, Z.
spellingShingle	Tan, L.S. Koh, S.H. Prakash, S. Choi, W.K. Zhang, Z. Determination of minority carrier diffusion lengths in the denuded zones of silicon wafers by surface photovoltage measurements
author_sort	Tan, L.S.
title	Determination of minority carrier diffusion lengths in the denuded zones of silicon wafers by surface photovoltage measurements
title_short	Determination of minority carrier diffusion lengths in the denuded zones of silicon wafers by surface photovoltage measurements
title_full	Determination of minority carrier diffusion lengths in the denuded zones of silicon wafers by surface photovoltage measurements
title_fullStr	Determination of minority carrier diffusion lengths in the denuded zones of silicon wafers by surface photovoltage measurements
title_full_unstemmed	Determination of minority carrier diffusion lengths in the denuded zones of silicon wafers by surface photovoltage measurements
title_sort	determination of minority carrier diffusion lengths in the denuded zones of silicon wafers by surface photovoltage measurements
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/72572
_version_	1821210856060354560

Determination of minority carrier diffusion lengths in the denuded zones of silicon wafers by surface photovoltage measurements

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