ELECTRON TRAJECTORY TRACKING ALGORITHMS FOR ANALYSING VOLTAGE CONTRAST SIGNALS IN THE SCANNING ELECTRON MICROSCOPE.

ELECTRON TRAJECTORY TRACKING ALGORITHMS FOR ANALYSING VOLTAGE CONTRAST SIGNALS IN THE SCANNING ELECTRON MICROSCOPE.

Journal of Physics D: Applied Physics

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Bibliographic Details
Main Authors: Chim, W.K., Low, T.S., Chan, D.S.H., Phang, J.C.H.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62129
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Institution: National University of Singapore

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http://scholarbank.nus.edu.sg/handle/10635/62129

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