Hot-carrier reliability of non-degenerately doped tungsten polycide gate buried-channel p-MOSFETs
Solid-State Electronics
Saved in:
| Main Authors: | , , , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Published: |
2014
|
| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/62291 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | National University of Singapore |
| id |
sg-nus-scholar.10635-62291 |
|---|---|
| record_format |
dspace |
| spelling |
sg-nus-scholar.10635-622912015-01-28T17:16:47Z Hot-carrier reliability of non-degenerately doped tungsten polycide gate buried-channel p-MOSFETs Lou, C.L. Chim, W.K. Chan, D.S.H. Pan, Y. ELECTRICAL ENGINEERING Solid-State Electronics 41 8 1171-1176 SSELA 2014-06-17T06:49:28Z 2014-06-17T06:49:28Z 1997-08 Article Lou, C.L.,Chim, W.K.,Chan, D.S.H.,Pan, Y. (1997-08). Hot-carrier reliability of non-degenerately doped tungsten polycide gate buried-channel p-MOSFETs. Solid-State Electronics 41 (8) : 1171-1176. ScholarBank@NUS Repository. 00381101 http://scholarbank.nus.edu.sg/handle/10635/62291 NOT_IN_WOS Scopus |
| institution |
National University of Singapore |
| building |
NUS Library |
| country |
Singapore |
| collection |
ScholarBank@NUS |
| description |
Solid-State Electronics |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Lou, C.L. Chim, W.K. Chan, D.S.H. Pan, Y. |
| format |
Article |
| author |
Lou, C.L. Chim, W.K. Chan, D.S.H. Pan, Y. |
| spellingShingle |
Lou, C.L. Chim, W.K. Chan, D.S.H. Pan, Y. Hot-carrier reliability of non-degenerately doped tungsten polycide gate buried-channel p-MOSFETs |
| author_sort |
Lou, C.L. |
| title |
Hot-carrier reliability of non-degenerately doped tungsten polycide gate buried-channel p-MOSFETs |
| title_short |
Hot-carrier reliability of non-degenerately doped tungsten polycide gate buried-channel p-MOSFETs |
| title_full |
Hot-carrier reliability of non-degenerately doped tungsten polycide gate buried-channel p-MOSFETs |
| title_fullStr |
Hot-carrier reliability of non-degenerately doped tungsten polycide gate buried-channel p-MOSFETs |
| title_full_unstemmed |
Hot-carrier reliability of non-degenerately doped tungsten polycide gate buried-channel p-MOSFETs |
| title_sort |
hot-carrier reliability of non-degenerately doped tungsten polycide gate buried-channel p-mosfets |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/62291 |
| _version_ |
1681085749001191424 |