Investigation of interface traps in LDD pMOST's by the DCIV method
IEEE Electron Device Letters
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2014
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sg-nus-scholar.10635-623562021-10-05T10:02:24Z Investigation of interface traps in LDD pMOST's by the DCIV method Jie, B.B. Li, M.F. Lou, C.L. Chim, W.K. Chan, D.S.H. Lo, K.F. ELECTRICAL ENGINEERING IEEE Electron Device Letters 18 12 583-585 EDLED 2014-06-17T06:50:10Z 2014-06-17T06:50:10Z 1997-12 Jie, B.B., Li, M.F., Lou, C.L., Chim, W.K., Chan, D.S.H., Lo, K.F. (1997-12). Investigation of interface traps in LDD pMOST's by the DCIV method. IEEE Electron Device Letters 18 (12) : 583-585. ScholarBank@NUS Repository. 07413106 http://scholarbank.nus.edu.sg/handle/10635/62356 A1997YH55200003 Scopus |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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NUS Library |
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| description |
IEEE Electron Device Letters |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Jie, B.B. Li, M.F. Lou, C.L. Chim, W.K. Chan, D.S.H. Lo, K.F. |
| author |
Jie, B.B. Li, M.F. Lou, C.L. Chim, W.K. Chan, D.S.H. Lo, K.F. |
| spellingShingle |
Jie, B.B. Li, M.F. Lou, C.L. Chim, W.K. Chan, D.S.H. Lo, K.F. Investigation of interface traps in LDD pMOST's by the DCIV method |
| author_sort |
Jie, B.B. |
| title |
Investigation of interface traps in LDD pMOST's by the DCIV method |
| title_short |
Investigation of interface traps in LDD pMOST's by the DCIV method |
| title_full |
Investigation of interface traps in LDD pMOST's by the DCIV method |
| title_fullStr |
Investigation of interface traps in LDD pMOST's by the DCIV method |
| title_full_unstemmed |
Investigation of interface traps in LDD pMOST's by the DCIV method |
| title_sort |
investigation of interface traps in ldd pmost's by the dciv method |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/62356 |
| _version_ |
1713205670849806336 |