Modelling the degradation in the subthreshold characteristics of submicrometre LDD PMOSFETs under hot-carrier stressing
10.1088/0268-1242/13/5/003
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sg-nus-scholar.10635-624332023-10-25T22:04:34Z Modelling the degradation in the subthreshold characteristics of submicrometre LDD PMOSFETs under hot-carrier stressing Qin, W.H. Chim, W.K. Chan, D.S.H. Lou, C.L. ELECTRICAL ENGINEERING 10.1088/0268-1242/13/5/003 Semiconductor Science and Technology 13 5 453-459 SSTEE 2014-06-17T06:50:59Z 2014-06-17T06:50:59Z 1998-05 Article Qin, W.H., Chim, W.K., Chan, D.S.H., Lou, C.L. (1998-05). Modelling the degradation in the subthreshold characteristics of submicrometre LDD PMOSFETs under hot-carrier stressing. Semiconductor Science and Technology 13 (5) : 453-459. ScholarBank@NUS Repository. https://doi.org/10.1088/0268-1242/13/5/003 02681242 http://scholarbank.nus.edu.sg/handle/10635/62433 000073617400001 Scopus |
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National University of Singapore |
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| description |
10.1088/0268-1242/13/5/003 |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Qin, W.H. Chim, W.K. Chan, D.S.H. Lou, C.L. |
| format |
Article |
| author |
Qin, W.H. Chim, W.K. Chan, D.S.H. Lou, C.L. |
| spellingShingle |
Qin, W.H. Chim, W.K. Chan, D.S.H. Lou, C.L. Modelling the degradation in the subthreshold characteristics of submicrometre LDD PMOSFETs under hot-carrier stressing |
| author_sort |
Qin, W.H. |
| title |
Modelling the degradation in the subthreshold characteristics of submicrometre LDD PMOSFETs under hot-carrier stressing |
| title_short |
Modelling the degradation in the subthreshold characteristics of submicrometre LDD PMOSFETs under hot-carrier stressing |
| title_full |
Modelling the degradation in the subthreshold characteristics of submicrometre LDD PMOSFETs under hot-carrier stressing |
| title_fullStr |
Modelling the degradation in the subthreshold characteristics of submicrometre LDD PMOSFETs under hot-carrier stressing |
| title_full_unstemmed |
Modelling the degradation in the subthreshold characteristics of submicrometre LDD PMOSFETs under hot-carrier stressing |
| title_sort |
modelling the degradation in the subthreshold characteristics of submicrometre ldd pmosfets under hot-carrier stressing |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/62433 |
| _version_ |
1781782149532221440 |